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Frontiers in Electronic Testing

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Introduction to IDDQ Testing
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A Designer¿s Guide to Built-In Self-Test
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Design for AT-Speed Test, Diagnosis and Measurement
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High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
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SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
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Formal Equivalence Checking and Design Debugging
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Research Perspectives and Case Studies in System Test and Diagnosis
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Boundary-Scan Interconnect Diagnosis
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On-Line Testing for VLSI
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Delay Fault Testing for VLSI Circuits
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Testability Concepts for Digital ICs: The Macro Test Approach
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Efficient Branch and Bound Search with Application to Computer-Aided Design
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications
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Multi-Chip Module Test Strategies
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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
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Embedded Processor-Based Self-Test
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Introduction to Advanced System-on-Chip Test Design and Optimization
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Elements of STIL: Principles and Applications of IEEE Std. 1450
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Verification by Error Modeling: Using Testing Techniques in Hardware Verification
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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
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Data Mining and Diagnosing IC Fails
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Advances in Electronic Testing: Challenges and Methodologies
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Oscillation-Based Test in Mixed-Signal Circuits
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
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Fault Diagnosis of Analog Integrated Circuits
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Fault-Tolerance Techniques for SRAM-Based FPGAs
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Boundary-Scan Interconnect Diagnosis
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Rasta: 66
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