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Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
| Autorius: | Henning Friis Poulsen |
| Serija: | Springer Tracts in Modern Physics |
| Leidėjas: | Springer Berlin Heidelberg |
| Išleidimo metai: | 2013 |
| Knygos puslapių skaičius: | 172 |
| ISBN-10: | 366214543X |
| ISBN-13: | 9783662145432 |
| Formatas: | 235 x 155 x 10 mm. Knyga minkštu viršeliu |
| Kalba: | Anglų |
Parašykite atsiliepimą apie „Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and their Dynamics“
