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This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
Autorius: | Xiong Du, Jun Zhang, Rui Du, Yaoyi Yu, Cheng Qian, Gaoxian Li, |
Serija: | CPSS Power Electronics Series |
Leidėjas: | Springer Nature Singapore |
Išleidimo metai: | 2023 |
Knygos puslapių skaičius: | 188 |
ISBN-10: | 9811931348 |
ISBN-13: | 9789811931345 |
Formatas: | 235 x 155 x 10 mm. Knyga minkštu viršeliu |
Kalba: | Anglų |
Parašykite atsiliepimą apie „Thermal Reliability of Power Semiconductor Device in the Renewable Energy System“