In "The gm/ID Methodology, a Sizing Tool for Low-Voltage Analog CMOS Circuits", we compare the semi-empirical to the compact model approach. Small numbers of parameters make the compact model attractive for the model paves the way towards analytic expressions unaffordable otherwise. The E.K.V model is a good candidate, but when it comes to short channel devices, compact models are either inaccurate or loose straightforwardness. Because sizing requires basically a reliable large signal representation of MOS transistors, we investigate the potential of the E.K.V model when its parameters are supposed to be bias dependent. The model-driven and semi-empirical methods are compared considering the Intrinsic Gain Stage and a few more complex circuits. A series of MATLAB files found on extras-springer.com allow redoing the tests.
| Autorius: | Paul Jespers |
| Serija: | Analog Circuits and Signal Processing |
| Leidėjas: | Springer US |
| Išleidimo metai: | 2012 |
| Knygos puslapių skaičius: | 188 |
| ISBN-10: | 1461425050 |
| ISBN-13: | 9781461425052 |
| Formatas: | 235 x 155 x 11 mm. Knyga minkštu viršeliu |
| Kalba: | Anglų |
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