Atnaujintas knygų su minimaliais defektais pasiūlymas! Naršykite ČIA >>
With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.
| Autorius: | Narendra Devta-Prasanna |
| Leidėjas: | LAP LAMBERT Academic Publishing |
| Išleidimo metai: | 2010 |
| Knygos puslapių skaičius: | 116 |
| ISBN-10: | 3838312198 |
| ISBN-13: | 9783838312194 |
| Formatas: | 220 x 150 x 7 mm. Knyga minkštu viršeliu |
| Kalba: | Anglų |
Parašykite atsiliepimą apie „Testing Sequence Dependent Defects: New Methods of Applying Two-pattern Tests and Testing Sequence Dependent Defects“
