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In Test Pattern Generation using Boolean Proof Engines, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
| Autorius: | Rolf Drechsler, Daniel Tille, Görschwin Fey, Stephan Eggersglüß, |
| Leidėjas: | Springer Netherlands |
| Išleidimo metai: | 2010 |
| Knygos puslapių skaičius: | 204 |
| ISBN-10: | 9048184916 |
| ISBN-13: | 9789048184910 |
| Formatas: | 235 x 155 x 12 mm. Knyga minkštu viršeliu |
| Kalba: | Anglų |
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