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Progress in Nanoscale Characterization and Manipulation

-15% su kodu: ENG15
165,57 
Įprasta kaina: 194,79 
-15% su kodu: ENG15
Kupono kodas: ENG15
Akcija baigiasi: 2025-03-03
-15% su kodu: ENG15
165,57 
Įprasta kaina: 194,79 
-15% su kodu: ENG15
Kupono kodas: ENG15
Akcija baigiasi: 2025-03-03
-15% su kodu: ENG15
2025-02-28 194.7900 InStock
Nemokamas pristatymas į paštomatus per 11-15 darbo dienų užsakymams nuo 10,00 

Knygos aprašymas

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.
The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

Informacija

Serija: Springer Tracts in Modern Physics
Leidėjas: Springer Nature Singapore
Išleidimo metai: 2019
Knygos puslapių skaičius: 516
ISBN-10: 9811344205
ISBN-13: 9789811344206
Formatas: 235 x 155 x 28 mm. Knyga minkštu viršeliu
Kalba: Anglų

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