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The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e.g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.
| Autorius: | Hartmut S. Leipner, Reinhard Krause-Rehberg, |
| Serija: | Springer Series in Solid-State Sciences |
| Leidėjas: | Springer Berlin Heidelberg |
| Išleidimo metai: | 2010 |
| Knygos puslapių skaičius: | 400 |
| ISBN-10: | 3642084036 |
| ISBN-13: | 9783642084034 |
| Formatas: | 235 x 155 x 22 mm. Knyga minkštu viršeliu |
| Kalba: | Anglų |
Parašykite atsiliepimą apie „Positron Annihilation in Semiconductors: Defect Studies“
