Noncontact Atomic Force Microscopy

-15% su kodu: ENG15
287,96 
Įprasta kaina: 338,78 
-15% su kodu: ENG15
Kupono kodas: ENG15
Akcija baigiasi: 2025-03-03
-15% su kodu: ENG15
287,96 
Įprasta kaina: 338,78 
-15% su kodu: ENG15
Kupono kodas: ENG15
Akcija baigiasi: 2025-03-03
-15% su kodu: ENG15
2025-02-28 338.7800 InStock
Nemokamas pristatymas į paštomatus per 11-15 darbo dienų užsakymams nuo 10,00 

Knygos aprašymas

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Informacija

Serija: NanoScience and Technology
Leidėjas: Springer Berlin Heidelberg
Išleidimo metai: 2012
Knygos puslapių skaičius: 460
ISBN-10: 3642627722
ISBN-13: 9783642627729
Formatas: 235 x 155 x 25 mm. Knyga minkštu viršeliu
Kalba: Anglų

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