Atnaujintas knygų su minimaliais defektais pasiūlymas! Naršykite ČIA >>
Taking a three-pronged approach ¿ test engineering from traditional-test, design and manufacturing view-points ¿ Integrated Circuit Test Engineering encapsulates the subject as it stands today. After introductory background from basic testing rules to trends in technology, the reader learns about: fabrication processes; a complete range of detailed tests and procedures; how to design for testability; fault simulation; automatic test equipment and the economics of testing. The text incudes: ¿ Worked examples and exercises, well-organized references and bibliography. ¿ An introduction to the use of various software and languages such as MATLAB®, Spice, Verilog®-HDL and VHDL. ¿ A series of experiments based on material downloaded from springeronline.com showing how to construct a hardware test arrangement for MS Windows PCs. This book is a practical tool for advanced undergraduate and graduate electronic engineering students, a resource for their tutors and a guide for the practising electronic engineer.
| Autorius: | Ian A. Grout |
| Leidėjas: | Springer London |
| Išleidimo metai: | 2005 |
| Knygos puslapių skaičius: | 396 |
| ISBN-10: | 1846280230 |
| ISBN-13: | 9781846280238 |
| Formatas: | 235 x 155 x 22 mm. Knyga minkštu viršeliu |
| Kalba: | Anglų |
Parašykite atsiliepimą apie „Integrated Circuit Test Engineering: Modern Techniques“
