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This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
| Autorius: | Nicolas Brodusch, Raynald Gauvin, Hendrix Demers, |
| Serija: | SpringerBriefs in Applied Sciences and Technology |
| Leidėjas: | Springer Nature Singapore |
| Išleidimo metai: | 2017 |
| Knygos puslapių skaičius: | 152 |
| ISBN-10: | 9811044325 |
| ISBN-13: | 9789811044328 |
| Formatas: | 235 x 155 x 9 mm. Knyga minkštu viršeliu |
| Kalba: | Anglų |
Parašykite atsiliepimą apie „Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization“
