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Evaluation of spot blotch resistance in spring wheat germplasm: Spot blotch resistance in wheat

-15% su kodu: ENG15
48,81 
Įprasta kaina: 57,42 
-15% su kodu: ENG15
Kupono kodas: ENG15
Akcija baigiasi: 2025-03-03
-15% su kodu: ENG15
48,81 
Įprasta kaina: 57,42 
-15% su kodu: ENG15
Kupono kodas: ENG15
Akcija baigiasi: 2025-03-03
-15% su kodu: ENG15
2025-02-28 57.4200 InStock
Nemokamas pristatymas į paštomatus per 11-15 darbo dienų užsakymams nuo 20,00 

Knygos aprašymas

The investigation on wheat was conducted with the objective to study variability for spot blotch resistance caused by B. sorokiniana in the wheat germplasm lines and to find out the distribution of resistance across various height and maturity groups. Observations were recorded for disease severity (%) as well as using 0-9 scale. Disease was rated three times i.e. at growth stages 69, 77 and 83 (Zadoks et.al.1974) to calculate AUDPC. Plant height, days to maturity and test weight was also recorded for each genotype. A wide variability for resistance to spot blotch was observed in the wheat lines screened.15 lines were found to have resistant. The proportion of moderately resistant, moderately susceptible and susceptible lines were 47%, 43% and 6% respectively.The useful resistant lines having dwarf stature and early days to maturity were 15. These lines can be exploited in crossing programme to developing spot blotch resistant early maturing lines suited to rice wheat cropping system of NEPZ.Differential reaction was also observed in same line that supported the idea of independent gene control.

Informacija

Autorius: Manoj Kumar, A. K. Mauriya,
Leidėjas: LAP LAMBERT Academic Publishing
Išleidimo metai: 2013
Knygos puslapių skaičius: 56
ISBN-10: 3659401382
ISBN-13: 9783659401381
Formatas: 220 x 150 x 4 mm. Knyga minkštu viršeliu
Kalba: Anglų

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