Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
| Autorius: | T. Oikawa, Daisuke Shindo, |
| Leidėjas: | Springer Japan |
| Išleidimo metai: | 2002 |
| Knygos puslapių skaičius: | 168 |
| ISBN-10: | 4431703365 |
| ISBN-13: | 9784431703365 |
| Formatas: | 280 x 210 x 10 mm. Knyga minkštu viršeliu |
| Kalba: | Anglų |
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