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Guido Groeseneken

Rasta: 4
ESD Protection Challenges: FinFET Technology and RF CMOS Circuits
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96,65 
113,70 
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Bias-Temperature-Instabilities in MOSFETs with high-k dielectrics: Electrical behavior, modeling and process impact under Bias Temperature stress in high-k metal gated MOSFETs
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113,70 
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
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143,97 
169,38 
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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
-15% su kodu: ENG15
143,97 
169,38 
Išsiųsime per 11-15 d. d.
Rasta: 4